The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 03, 2009
Filed:
Feb. 19, 2003
Hong Wang, Fremont, CA (US);
Per Hammarlund, Hillsboro, OR (US);
Xiang Zou, Beaverton, OR (US);
John Shen, San Jose, CA (US);
Xinmin Tian, Union City, CA (US);
Milind Girkar, Sunnyvale, CA (US);
Perry Wang, San Jose, CA (US);
Piyush Desai, Pleasanton, CA (US);
Hong Wang, Fremont, CA (US);
Per Hammarlund, Hillsboro, OR (US);
Xiang Zou, Beaverton, OR (US);
John Shen, San Jose, CA (US);
Xinmin Tian, Union City, CA (US);
Milind Girkar, Sunnyvale, CA (US);
Perry Wang, San Jose, CA (US);
Piyush Desai, Pleasanton, CA (US);
Intel Corporation, Santa Clara, CA (US);
Abstract
Method, apparatus, and program means for a programmable event driven yield mechanism that may activate other threads. In one embodiment, an apparatus includes execution resources to execute a plurality of instructions and a monitor to detect a condition indicating a low level of progress. The monitor can disrupt processing of a program by transferring to a handler in response to detecting the condition indicating a low level of progress. In another embodiment, thread switch logic may be coupled to a plurality of event monitors which monitor events within the multithreading execution logic. The thread switch logic switches threads based at least partially on a programmable condition of one or more of the performance monitors.