The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 03, 2009
Filed:
Dec. 15, 2006
Jeanne Paulette Spence Bickford, Essex Juntion, VT (US);
John Robert Goss, South Burlington, VT (US);
Nazmul Habib, South Burlington, VT (US);
Robert J. Mcmahon, Essex Junction, VT (US);
Jeanne Paulette Spence Bickford, Essex Juntion, VT (US);
John Robert Goss, South Burlington, VT (US);
Nazmul Habib, South Burlington, VT (US);
Robert J. McMahon, Essex Junction, VT (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A parametric-based design methodology interlocks the design of library elements used in a semiconductor product design with the testing protocol used for the resulting semiconductor products such that parametric assumptions made regarding library elements used in a semiconductor product design may be used to disposition products such as semiconductor chips incorporating a semiconductor product design. In particular, a parametric measurement element is incorporated into a product design along with one or more library elements, with the parametric measurement element used to test one or more parametric design points that are associated with the library elements when the product design is used in a manufactured product.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile