The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 03, 2009

Filed:

Apr. 28, 2005
Applicants:

Hendrik Hartono, San Jose, CA (US);

Benjamin Louie, Fremont, CA (US);

Aaron Yip, Santa Clara, CA (US);

Hagop A. Nazarian, San Jose, CA (US);

Inventors:

Hendrik Hartono, San Jose, CA (US);

Benjamin Louie, Fremont, CA (US);

Aaron Yip, Santa Clara, CA (US);

Hagop A. Nazarian, San Jose, CA (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 15/00 (2006.01); G11C 7/06 (2006.01); G11C 16/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

A non-volatile memory device and data comparison circuit are described that facilitate the comparison of data between two blocks of data, such as the I/O buffer or data cache of a memory and the sense amplifiers, that allow for simple and rapid comparison of data bits and results in a signal flag indicating a data match or a mis-match. This allows for a simple parallel data bit comparison capability that allows a fast initial comparison result without requiring a time-consuming individual bit-by-bit data comparison. In one embodiment, two data blocks to be compared are divided into a number of paired segments, wherein each pair of segments are compared in parallel by a data comparison circuit, such that a mis-match can be located to the affected data segments or the results logically combined to indicate a match or mis-match for the complete data blocks.


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