The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 27, 2009
Filed:
Aug. 18, 2006
Applicants:
Markus Hofsäss, München, DE;
Eva-maria Nash, Adelshofen, DE;
Inventors:
Markus Hofsäss, München, DE;
Eva-Maria Nash, Adelshofen, DE;
Assignee:
Qimonda AG, Munich, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01); G06F 19/00 (2006.01); G06F 11/00 (2006.01); G01R 31/26 (2006.01); G01R 31/317 (2006.01); G01R 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A layout comprises a plurality of elemental areas which define the shape and arrangement of patterns of an integrated circuit. A method for searching for potential faults in the layout begins with dividing the layout into sections. One of a number of predetermined classes is allocated to a section by means of allocation criteria. An evaluation criterion allocated to the class which was allocated to the section is then applied to the section in order to obtain an evaluation result. Each section is then identified as potentially faulted in dependence on the evaluation result.