The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 27, 2009
Filed:
Jun. 02, 2004
Koichi Oka, Otsu, JP;
Yoshi Enami, Ritto, JP;
Koichi Oka, Otsu, JP;
Yoshi Enami, Ritto, JP;
Otsuka Electronics Co., Ltd, Osaka, JP;
Abstract
A test pattern is moved on a screensubject to measurement with the field of view of an image sensor pursuing the motion of the test pattern so as to observe BEW. Subsequently, the field of viewof the image sensor is moved at the same velocity vc as in the foregoing observation to capture an image of a static pattern PE, and a blur width W along the scrolling direction that appears in a distribution profile of the captured image is observed. Based upon the blur width W and the exposure time of the image sensor for capturing the image of the static pattern PE, the moving velocity of the test pattern at the time of observation of the BEW is estimated, and by using the moving velocity, the BEW is normalized. Evaluation of the moving image quality of the screen is carried out by using the normalized N BEW. The moving velocity of the original test pattern can thus be estimated easily and accurately, and accordingly, the moving image quality of the screen can be evaluated accurately.