The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 27, 2009
Filed:
Nov. 17, 2005
Applicants:
David F. Lewis, Monroe, CT (US);
Carl A. Listl, New Hyde Park, NY (US);
Xiang Yu, Bridgewater, NJ (US);
Inventors:
David F. Lewis, Monroe, CT (US);
Carl A. Listl, New Hyde Park, NY (US);
Xiang Yu, Bridgewater, NJ (US);
Assignee:
ISP Investments Inc., Wilmington, DE (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01T 1/08 (2006.01); G01D 18/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
An article of manufacture comprising a radiation sensitive material, and a measuring scale that is part of the radiation sensitive material. A method of measuring at least one parameter relating to an irradiated material is also described. A radiation sensitive material including a measuring scale is exposed to radiation and at least one parameter relating to one or more exposed areas of the material is measured by reference to the measuring scale on the material.