The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 27, 2009

Filed:

Oct. 19, 2005
Applicant:

Hai Xing Chen, Toronto, Ontario, CA;

Inventor:

Hai Xing Chen, Toronto, Ontario, CA;

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C12Q 1/68 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of enhancing detection signal for measurement of nucleic acid sequences includes providing a T- or L-primary probe having a target-binding segment and an enhancer linker segment; and hybridizing the primary probe with a target sequence of interest; providing a first enhancement probe having a first annealing segment complementary to the enhancer linker segment, a second annealing segment and a chemical label; hybridizing the first enhancement probe to the primary probe; providing a second enhancement probe having a first annealing segment complementary to the second annealing segment of the first enhancement probe, a second annealing segment complementary to the first annealing segment of the first enhancement probe, and the same chemical label; hybridizing the first and second enhancement probes, thereby multiple first and second enhancement probes annealing with each other forming a staggered chain extending from the primary probe; and detecting the chemical labels in the final complex.


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