The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 20, 2009
Filed:
Jan. 18, 2005
Matthew Stephen Angyal, Stormville, NY (US);
Alina Deutsch, Chappaqua, NY (US);
Ibrahim M. Elfadel, Ossining, NY (US);
Zhichao Zhang, Tempe, AZ (US);
Matthew Stephen Angyal, Stormville, NY (US);
Alina Deutsch, Chappaqua, NY (US);
Ibrahim M. Elfadel, Ossining, NY (US);
Zhichao Zhang, Tempe, AZ (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
Techniques are disclosed for determination of parameter variability for one or more given interconnects of a plurality of interconnects in a simulated semiconductor circuit. The simulated semiconductor circuit is defined at least in part by a plurality of input parameters. From a distribution of first values of a given input parameter, a plurality of the first values are determined to use when calculating a corresponding plurality of second values for each of one or more output parameters. By using at least the determined plurality of first values for the given input parameter and selected values for other input parameters in the plurality of input parameters, the corresponding plurality of second values are calculated for each of the one or more output parameters. The one or more output parameters correspond to the one or more given interconnects. Each of the second values corresponds to one of the determined plurality of first values.