The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 06, 2009

Filed:

Mar. 18, 2005
Applicants:

William K. Lam, Newark, CA (US);

Shrenik M. Mehta, San Jose, CA (US);

Inventors:

William K. Lam, Newark, CA (US);

Shrenik M. Mehta, San Jose, CA (US);

Assignee:

Sun Microsystems, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01); G06F 9/45 (2006.01);
U.S. Cl.
CPC ...
Abstract

Techniques are disclosed for automatically determining whether a potential constraint set to be applied to a portion of a circuit are overconstrained. An environment circuit supplies inputs to the circuit portion. Embodiments of the invention recognize that if the environment circuit produces a set of outputs that contain a pattern that is not present in the potential constraint set, then the potential constraint set is overconstrained. A verification tool establishes the properties for the environmental circuit based on the potential constraint set. If the verification tool determines that the outputs produced by the environment circuit conflict with the properties of the environment circuit, then the verification tool concludes that the potential constraint set is overconstrained, because the environment circuit produces a pattern that is not present in the potential constraint set. Advantageously, the laborious and error-prone process of manually determining the proper inputs to apply during formal verification is avoided.


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