The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 06, 2009

Filed:

Oct. 25, 2002
Applicant:

Sunil K Jain, Folsom, CA (US);

Inventor:

Sunil K Jain, Folsom, CA (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

Embodiments of the invention provide a flexible probe head that improves contact force and uniform mechanical contact pressure between the probe feature and an engaged bond pad. Flexible probe head is formed from a plurality of conductive wires embedded in a high frequency elastomer material. During wafer sort, the flexible probe head is in contact communication with die under test. The flexible probe head assumes the natural co-planarity of the surface of the die under test and sort interface unit.


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