The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 06, 2009

Filed:

Nov. 14, 2006
Applicant:

Helmut Fischer, Oberägeri, CH;

Inventor:

Helmut Fischer, Oberägeri, CH;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 7/28 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention relates to a Measuring probe for a device for the measurement of the thickness of thin layers, with a housing () comprising at least one sensor element (), which is accepted along a longitudinal axis () of the housing () at least slightly movable to the housing () and with a contact spherical cap () assigned to the at least one sensor element () for setting the measuring probe () onto a surface of a measuring object, wereby in that the at least one sensor element () is accepted by a holding element ()—along the longitudinal axis () of the housing ()—which is designed spring-loaded resiliently and which is fastened on the housing ().


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