The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 30, 2008

Filed:

Mar. 04, 2004
Applicants:

Katsumi Maeda, Tokyo, JP;

Kaichiro Nakano, Tokyo, JP;

Inventors:

Katsumi Maeda, Tokyo, JP;

Kaichiro Nakano, Tokyo, JP;

Assignee:

NEC Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03F 7/039 (2006.01); G08F 32/08 (2006.01); C07C 35/52 (2006.01); C07C 69/65 (2006.01); C07C 43/178 (2006.01);
U.S. Cl.
CPC ...
Abstract

A noble alicyclic unsaturated compound represented by the general formula (1): wherein at least one of Rand Ris a fluorine atom or a fluorinated alkyl group; a polymer formed by the polymerization of a polymer precursor comprising the alicyclic compound. The polymer is useful, in the lithography using a light having a wavelength of 190 nm or less, as a chemically amplified resist which exhibits excellent transparency with respect to the light for use in exposure and also is excellent in the adhesion to a substrate and the resistance to dry etching.


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Maeda, Katsumi. (2008). Alicyclic unsaturated compound, polymer, chemically amplified resist composition and method for forming pattern using said composition (U.S. Patent No. 7470499). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7470499

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