The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 23, 2008
Filed:
Oct. 19, 2007
Kent Nguyen, San Jose, CA (US);
Eric Thompson, San Jose, CA (US);
Hai Tran, San Jose, CA (US);
Kaushal Gangakhedkar, San Jose, CA (US);
Robert Barnett, San Jose, CA (US);
Daniel Toet, Santa Clara, CA (US);
David Baldwin, Atascadero, CA (US);
Steve Aochi, Morgan Hill, CA (US);
Neil Nguyen, Milpitas, CA (US);
Kent Nguyen, San Jose, CA (US);
Eric Thompson, San Jose, CA (US);
Hai Tran, San Jose, CA (US);
Kaushal Gangakhedkar, San Jose, CA (US);
Robert Barnett, San Jose, CA (US);
Daniel Toet, Santa Clara, CA (US);
David Baldwin, Atascadero, CA (US);
Steve Aochi, Morgan Hill, CA (US);
Neil Nguyen, Milpitas, CA (US);
Photon Dynamics, Inc., San Jose, CA (US);
Abstract
A system performs continuous full linear scan of a flat media. The system includes, in part, a chuck, and at least first, second and third gantries. The chuck is adapted to support the flat media during the test. The first gantry includes at least one linear array of non-contacting sensors that spans the width of the flat media and is adapted to move across an entire length of the flat media. Each of the second and third gantries includes a probe head that spans the width of the flat media and each is adapted to apply an electrical signal to the flat media. Each probe head is further adapted to move along a direction substantially perpendicular to the surface of the flat media during the times when the first gantry is in motion and while test signals are being continuously applied.