The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 16, 2008
Filed:
Oct. 04, 2007
Mark S. Gorbics, Franklin Lakes, NJ (US);
Mark S. Gorbics, Franklin Lakes, NJ (US);
LeCroy Corporation, Chestnut Ridge, NY (US);
Abstract
Methods for processing waveforms may include decimating an over-sampled waveform by identifying samples for which the sample's position within a data period indicates that is closest to a selected time within a data period. In some example applications, the selected time may be determined as a preferred time to sample the waveform within a data period. In an illustrative example, a sequence of samples representing an over-sampled waveform may be reduced by identifying a sample in each data period that is closest in time to the selected time. In another illustrative example, a sample within each data period may be identified if it falls within a range that is a function of the selected time within the data period and an integral ratio of a sample period to the data period. The identified samples may be used to reconstruct the original waveform with fewer samples than the over-sampled waveform.