The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 16, 2008

Filed:

Jan. 19, 2005
Applicants:

Makoto Kurosawa, Saitama, JP;

Juichi Nakada, Gunma, JP;

Inventors:

Makoto Kurosawa, Saitama, JP;

Juichi Nakada, Gunma, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 23/20 (2006.01); G01R 23/16 (2006.01);
U.S. Cl.
CPC ...
Abstract

A phase measurement device measures an output of an amplifier when an input signal having input frequency components is fed to the amplifier, and includes multipliers for orthogonally transforming the output of the amplifier a phase acquisition section for acquiring phases θand θof the input frequency components in the output of the multipliers, and θand θ(third distortion), and θand θ(fifth distortion) of the distortion components, a match time/phase measurement section for measuring a match time point Δt when θand θmatch each other and a distortion component phase measurement section for measuring phases θto θat the match time point Δt. The phase acquisition section acquires at least one of θand θ, and θand θ(with the frequencies higher than those of θand θ) or θand θ(with the frequencies lower than those of θand θ).


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