The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 02, 2008

Filed:

Jun. 14, 2006
Applicants:

Takayuki Gyoten, Tokyo, JP;

Fukashi Morishita, Tokyo, JP;

Katsumi Dosaka, Tokyo, JP;

Inventors:

Takayuki Gyoten, Tokyo, JP;

Fukashi Morishita, Tokyo, JP;

Katsumi Dosaka, Tokyo, JP;

Assignee:

Renesas Technology Corp., Chiyoda-Ku, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01K 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

There is provided a technique which is capable of detecting a temperature of a semiconductor device with high precision. A temperature detection circuit detecting a temperature of a semiconductor device includes a first short-cycle oscillator generating a first clock signal having positive temperature characteristics with respect to a frequency, a second short-cycle oscillator generating a second clock signal having negative temperature characteristics with respect to the frequency, and a temperature signal generation unit generating a temperature signal which is varied according to the temperature of the semiconductor device based on the first and second clock signals.


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