The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 02, 2008
Filed:
Jun. 01, 2006
Yasushige Ogawa, Kasugai, JP;
Yoshiyuki Ishida, Kasugai, JP;
Masato Matsumiya, Kawasaki, JP;
Fujitsu Limited, Kawasaki, JP;
Abstract
It is intended to provide a semiconductor integrated circuit device and adjustment method of the same semiconductor integrated circuit device, capable of adjusting an analog signal outputted from an incorporated analog signal generating section without outputting it outside as an analog value. An analog signal AOUT is outputted from an analog signal generating sectionin which an adjustment signal AD is inputted. The analog signal AOUT is inputted to a judgment section, in which it is compared and judged with a predetermined value and then a judgment signal JG is outputted. The judgment signal JG acts on a predetermined signal storing sectionas an internal signal and the adjustment signal AD is fetched into the predetermined signal storing section. Further, the judgment signal JG is outputted as digital signal through an external terminal Tand an external tester device acquires the adjustment signal and stores the acquired adjustment signal in the predetermined signal storing section. Consequently, the analog signal can be adjusted as analog value without being outputted outside and an adjustment test can be carried out with a simple tester device and according to a simple test method accurately and rapidly.