The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 25, 2008
Filed:
Dec. 30, 2005
Ebo H. Croffie, Portland, OR (US);
Nicolas K. Eib, San Jose, CA (US);
Ebo H. Croffie, Portland, OR (US);
Nicolas K. Eib, San Jose, CA (US);
LSI Logic Corporation, Milpitas, CA (US);
Abstract
A method and system are provided for analyzing process window compliance of an integrated circuit design. Aspects of the present invention include identifying layout pattern configurations that have process windows that fail to meet respective local performance specifications; searching for any layout pattern configurations in a design that substantially match any of the identified layout pattern configurations; and modifying any matching layout pattern configurations found in the design to make the layout pattern configurations compliant with their respective process windows.