The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 25, 2008

Filed:

Jun. 12, 2006
Applicants:

Emre Tuncer, Santa Cruz, CA (US);

Alessandra Nardi, Hayward, CA (US);

Srinath R. Naidu, Bangalore, IN;

Aliaksandr Antonau, Sunnyvale, CA (US);

Inventors:

Emre Tuncer, Santa Cruz, CA (US);

Alessandra Nardi, Hayward, CA (US);

Srinath R. Naidu, Bangalore, IN;

Aliaksandr Antonau, Sunnyvale, CA (US);

Assignee:

Magma Design Automation, Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01); G06F 9/45 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system and a method are disclosed for circuit analysis. A circuit modeling system calculates sensitivities of gates for statistical static timing analysis of a circuit. Timing distribution sensitivities of gates and correlations between the sensitivities are determined. A Monte Carlo simulation is run using the sensitivities to determine timing distribution of paths and determine probabilities of paths being the critical path. Aggregate sensitivities for cells are also determined.


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