The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7457996 B1

PDF
Full Text
Expired
Date of Patent:
Nov. 25, 2008

Filed:

Aug. 04, 2003
Applicants:

Soichi Kobayashi, Hyogo, JP;

Yoshiaki Yamazaki, Hyogo, JP;

Yukihiko Shimazu, Hyogo, JP;

Inventors:

Soichi Kobayashi, Hyogo, JP;

Yoshiaki Yamazaki, Hyogo, JP;

Yukihiko Shimazu, Hyogo, JP;

Assignee:

Renesas Technology Corp., Chiyoda-Ku, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01); G11C 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

In a test mode, a comparator compares for each column a value of data read from each memory cell connected to an activated word line with an expected value to be read from each memory cell. An error register holds error data based on a comparison result by a comparator. Each bit of the error data indicates the comparison result by the comparator for a corresponding column. Each bit is set to '0' when the comparison result for the corresponding column always indicates equality whichever word line is activated, and is set to '1' when once the comparison result for the corresponding column indicates difference.


Find Patent Forward Citations

Kobayashi, Soichi. (2008). Semiconductor integrated circuit capable of testing with small scale circuit configuration (U.S. Patent No. 7457996). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7457996

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