The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 25, 2008
Filed:
Apr. 04, 2005
Ajay Khoche, San Jose, CA (US);
Nicholas B Tufillaro, San Francisco, CA (US);
Stanley T. Jefferson, Palo Alto, CA (US);
Lee A. Barford, San Jose, CA (US);
Ajay Khoche, San Jose, CA (US);
Nicholas B Tufillaro, San Francisco, CA (US);
Stanley T. Jefferson, Palo Alto, CA (US);
Lee A. Barford, San Jose, CA (US);
Verigy (Singapore) Pte. Ltd., Singapore, SG;
Abstract
The model-based method tests compliance of production devices with the performance specifications of a device design. The production devices are manufactured in accordance with the device design by a manufacturing process. In the method, a simple model form based on the device design and the performance specifications is developed, a stimulus for testing the production devices is specified and each production device is tested. The model form has a basis function and model form parameters for the basis function. The model form parameters are dependent on the manufacturing process and differ in value among the production devices. A production device is tested by measuring the response of the production device to the stimulus; extracting, using the model form, the values of the model form parameters for the production device from the measured response and the stimulus; and checking compliance of the production device with the performance specifications using the extracted values of the model form parameters.