The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 25, 2008

Filed:

Mar. 27, 2006
Applicants:

Katsutaro Ichihara, Yokohama, JP;

Sumio Ashida, Edogawa-ku, JP;

Keiichiro Yusu, Yokohama, JP;

Toshihiko Nagase, Shibuya-ku, JP;

Naomasa Nakamura, Yokohama, JP;

Inventors:

Katsutaro Ichihara, Yokohama, JP;

Sumio Ashida, Edogawa-ku, JP;

Keiichiro Yusu, Yokohama, JP;

Toshihiko Nagase, Shibuya-ku, JP;

Naomasa Nakamura, Yokohama, JP;

Assignee:

Kabushiki Kaisha Toshiba, Kawasaki-shi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B 7/24 (2006.01);
U.S. Cl.
CPC ...
Abstract

A phase change recording medium comprising an as-deposited first recording layer configured to undergo a reversible phase change between an amorphous state and a crystalline state due to light irradiation and thereby change an optical characteristic. The as-deposited first recording layer includes a plurality of fine nuclei having an average size of 0.5 nm to 4 nm in the amorphous state.


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