The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 18, 2008
Filed:
Mar. 07, 2007
Neil J Goldfine, Newton, MA (US);
Mark D Windoloski, Chelmsford, MA (US);
Vladimir B Tsukernik, West Roxbury, MA (US);
Darrell E Schlicker, Watertown, MA (US);
Todd M Dunford, Waltham, MA (US);
Andrew P. Washabaugh, Chula Vista, CA (US);
Neil J Goldfine, Newton, MA (US);
Mark D Windoloski, Chelmsford, MA (US);
Vladimir B Tsukernik, West Roxbury, MA (US);
Darrell E Schlicker, Watertown, MA (US);
Todd M Dunford, Waltham, MA (US);
Andrew P. Washabaugh, Chula Vista, CA (US);
JENTEK Sensors, Inc., Waltham, MA (US);
Abstract
A set of curved components, such as the dovetail region of engine blades, are inspected by mounting each component into a circular carousel in a vertical orientation and rotating the carousel to move each component toward and away from an inspection site. The inspection site clamps a flexible eddy current sensor array to the curved material surface, scans the array over the surface, records the sensor position. A rigid element having a surface geometry similar to the surface shape of the component can be attached to the component to facilitate scanning of the sensor array over a component edge. The response of each sense element in the array may be converted into an effective material property and sense element proximity to the component material surface to verify the quality of the inspection scan and the presence of a defect such as a crack.