The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 11, 2008
Filed:
Feb. 24, 2004
Mitsunao Sekiwa, Osaka, JP;
Kazunori Tsutsui, Osaka, JP;
Katsuhiro Morisawa, Kyoto, JP;
Takashi Fujimoto, Kyoto, JP;
Atsushi Toyoshima, Osaka, JP;
Mitsunao Sekiwa, Osaka, JP;
Kazunori Tsutsui, Osaka, JP;
Katsuhiro Morisawa, Kyoto, JP;
Takashi Fujimoto, Kyoto, JP;
Atsushi Toyoshima, Osaka, JP;
Otsuka Electronics Co., Ltd., Osaka, JP;
Abstract
The present invention provides an electrophoretic mobility measuring apparatus capable of conducting measurement with high sensitivity with optical attenuation reduced by incidence of light through the electrode face. This apparatus comprises a transparent electrodeforming a part of a cell wall of a cellcapable of confining a sample, and the other electrodeopposite to the transparent electrode. A voltage is applied across these electrodes, and light is incident upon the inside of the cellthrough the transparent electrode. The scattering light which scatters from a sample S at a predetermined angle θ with respect to the incident angle, is received through the transparent electrode. The Doppler displacement is then measured based on the difference in frequency between the incident light and the outgoing light. The direction of the scattering vector which is the vector difference between incident and outgoing vectors, is substantially identical with that of the normal line h of the transparent electrode face.