The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 11, 2008

Filed:

Jun. 16, 2006
Applicant:

Helmut Fischer, Oberägeri, CH;

Inventor:

Helmut Fischer, Oberägeri, CH;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 21/08 (2006.01); G01B 7/06 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention relates to a calibration standard, especially for the calibration of devices for the non-destructive measurement of the thickness of thin layers, with a carrier layer () consisting of a basic material and a standard () applied on the carrier layer (), said standard having the thickness of the layer to be measured at which the device is to be calibrated, with the carrier layer () comprising a plane-parallel measuring surface () to its bearing surface (), that the standard () comprises a bearing surface () plane-parallel with its measuring surface () for bearing on the measuring surface () of the carrier layer (), and that the standard () is permanently provided on the carrier layer () by means of plating by rubbing.


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