The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 28, 2008

Filed:

Dec. 31, 2003
Applicants:

Suneel G. Mitbander, Phoenix, AZ (US);

Cass A. Blodgett, Phoenix, AZ (US);

Andrew W. Martwick, Folsom, CA (US);

Lyonel Renaud, Gilbert, AZ (US);

Theodore Z. Schoenborn, Portland, OR (US);

Inventors:

Suneel G. Mitbander, Phoenix, AZ (US);

Cass A. Blodgett, Phoenix, AZ (US);

Andrew W. Martwick, Folsom, CA (US);

Lyonel Renaud, Gilbert, AZ (US);

Theodore Z. Schoenborn, Portland, OR (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
Abstract

A serial point to point link that communicatively couples an integrated circuit (IC) device to another IC device is initialized by transferring a training sequence of symbols over the link. Registers of the IC device are programmed, to set a symbol data pattern and configure a lane transmitter for the link. A start bit in a register of the IC device is programmed, to request that the link be placed in a measurement mode. In this mode, the IC device instructs the other IC device to enter a loopback mode for the link. The IC device transmits a sequence of test symbols over the link and evaluates a loopback version of the sequence for errors. The sequence of test symbols have a data pattern, and are transmitted, as configured by the registers. Other embodiments are also described and claimed.


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