The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 28, 2008
Filed:
Apr. 26, 2006
Applicants:
Lars Erdmann, Hörselgau, DE;
Alexander Pesch, Jena, DE;
Arnaud Deparnay, Jena, DE;
Inventors:
Assignee:
Carl Zeiss SMS GmbH, Jena, DE;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 27/10 (2006.01);
U.S. Cl.
CPC ...
Abstract
The invention includes an optics array for beam shaping, which uses a micro lens combination, whose polygonal micro lenses are arranged in a level, whereby the geometric arrangement of the individual lenses and their diameters follow a distribution pattern. It is characterized by the fact that the number of corners as well as the length of the lens rims of each of the individual lenses of the micro lens combination is defined by a point distribution (P) of Voronoi points (), which define a Voronoi Region (VR(p)) which can be described by the following equations for a Voronoi lens ().