The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 28, 2008

Filed:

Dec. 06, 2006
Applicants:

Moises Cases, Austin, TX (US);

Daniel N. DE Araujo, Cedar Park, TX (US);

Bradley D. Herrman, Cary, NC (US);

Erdem Matoglu, Austin, TX (US);

Bhyrav M. Mutnury, Austin, TX (US);

Pravin S. Patel, Cary, NC (US);

Nam H. Pham, Round Rock, TX (US);

Inventors:

Moises Cases, Austin, TX (US);

Daniel N. de Araujo, Cedar Park, TX (US);

Bradley D. Herrman, Cary, NC (US);

Erdem Matoglu, Austin, TX (US);

Bhyrav M. Mutnury, Austin, TX (US);

Pravin S. Patel, Cary, NC (US);

Nam H. Pham, Round Rock, TX (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/02 (2006.01); G01R 31/26 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention is directed to an on-chip probing apparatus. In accordance with an embodiment of the present invention, the on-chip probing apparatus includes: a plurality of switches on a chip; a plurality of externally accessible probe points on the chip; and a multiplexer for controlling the plurality of switches to selectively couple an output signal of the chip to one of the plurality of probe points.


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