The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 21, 2008
Filed:
Oct. 18, 2004
Krishnamurthy Bhaskar, San Jose, CA (US);
Mark J. Roulo, Mountain View, CA (US);
Jason Z. Lin, Saratoga, CA (US);
Krishnamurthy Bhaskar, San Jose, CA (US);
Mark J. Roulo, Mountain View, CA (US);
Jason Z. Lin, Saratoga, CA (US);
KLA-Tencor Corporation, San Jose, CA (US);
Abstract
A system having a sensor array adapted to provide image data. A process node is connected to the sensor array, and analyzes portions of the image data. A job manager is connected to the process node, and instructs the process node to send the portions of the image data to a storage node. The storage node receives and stores the sent portions of the image data. In this manner, image data can be stored and run multiple times in order to tune a recipe for the analysis system. Because the same image data can be used over and over again, the recipe creating process can be more finely tuned to detect both the types of defects and at a level that is desired.