The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7440104 B1

PDF
Full Text
Expired
Date of Patent:
Oct. 21, 2008

Filed:

Nov. 07, 2005
Applicants:

Takashi Sato, Fujisawa, JP;

Kazuya Fukuhara, Tokyo, JP;

Keita Asanuma, Oita, JP;

Inventors:

Takashi Sato, Fujisawa, JP;

Kazuya Fukuhara, Tokyo, JP;

Keita Asanuma, Oita, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 4/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An exposure system includes an exposure tool configured to project grating patterns oriented in different directions onto test areas by a linearly polarized light, respectively, each of the grating patterns having a space width preventing higher order diffracted lights from an image formation, a data collector configured to collect sets of test optical intensity data on the test areas, and a polarization direction monitor configured to monitor a polarization direction of the linearly polarized light by comparing the sets of the test optical intensity data.


Find Patent Forward Citations

Sato, Takashi. (2008). Exposure system, test mask for monitoring polarization, and method for monitoring polarization (U.S. Patent No. 7440104). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7440104

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