The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 21, 2008

Filed:

Apr. 19, 2006
Applicants:

Jae-hwa Park, Gyeonggi-do, KR;

Jang-hee Lee, Gyeonggi-do, KR;

Dae-yong Kim, Gyeonggi-do, KR;

Hee-sook Park, Seoul, KR;

Inventors:

Jae-Hwa Park, Gyeonggi-do, KR;

Jang-Hee Lee, Gyeonggi-do, KR;

Dae-Yong Kim, Gyeonggi-do, KR;

Hee-Sook Park, Seoul, KR;

Assignee:

Samsung Electronics Co., Ltd., Suwon-si, Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/44 (2006.01); H01L 23/52 (2006.01);
U.S. Cl.
CPC ...
Abstract

In one embodiment, a semiconductor device comprises a semiconductor substrate and a doped conductive layer formed over the semiconductor substrate. A diffusion barrier layer is formed over the doped conductive layer. The diffusion barrier layer comprises an amorphous semiconductor material. After forming the diffusion barrier layer, a heat treatment process may be additionally performed thereon. An ohmic contact layer is formed over the diffusion barrier layer. A metal barrier layer is formed over the ohmic contact layer. A metal layer is formed over the metal barrier layer.


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