The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 14, 2008

Filed:

Feb. 06, 2004
Applicants:

Ankan Pramanick, Santa Clara, CA (US);

Mark Elston, Santa Clara, CA (US);

Leon Chen, Santa Clara, CA (US);

Robert Sauer, Santa Clara, CA (US);

Inventors:

Ankan Pramanick, Santa Clara, CA (US);

Mark Elston, Santa Clara, CA (US);

Leon Chen, Santa Clara, CA (US);

Robert Sauer, Santa Clara, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 27/28 (2006.01);
U.S. Cl.
CPC ...
Abstract

A distributed operating system for a semiconductor test system, such as automated test equipment (ATE), is described. The operating system includes a host operating system for enabling control of one or more site controllers by a system controller. One or more local operating systems, each associated with a site controller, enable control of one or more test modules by an associated site controller. Each test module performs testing on a corresponding device-under-test at a test site.


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