The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 14, 2008
Filed:
May. 25, 2006
Atsushi Ohtake, Hitachiota, JP;
Kinya Kobayashi, Hitachi, JP;
Toshiyuki Yokosuka, Hitachinaka, JP;
Kiyomi Yoshinari, Hitachi, JP;
Atsushi Ohtake, Hitachiota, JP;
Kinya Kobayashi, Hitachi, JP;
Toshiyuki Yokosuka, Hitachinaka, JP;
Kiyomi Yoshinari, Hitachi, JP;
Hitachi High-Technologies Corporation, Tokyo, JP;
Abstract
A tandem analysis system is provided for ionizing a substance, performing mass spectrometric analysis of various ion types generated, selecting and dissociating an ion type, the ion type having a specific mass-to-charge ratio, and thereby, repeating mass spectrometric analysis measurement on the ion of the ion type over n-th stages. A processing judges control content for the analysis next to MS(the n-th stage mass spectrometric analysis) within a predetermined time, based on ion intensity being represented by an ion peak with respect to the mass-to-charge ratio of each ion in the MSresult. An ion detection unit judges isotope-peak from the measured ionized data. Assuming that the MScount number of a parent-ion peptide measured during a certain constant time-interval is I, a data processing unit makes the MSintegration number-of-times or analysis time of the peptide proportional to 1/I.