The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 30, 2008

Filed:

Jul. 11, 2006
Applicants:

Deepak Kumar Nayak, Fremont, CA (US);

Yuhao Luo, San Jose, CA (US);

Inventors:

Deepak Kumar Nayak, Fremont, CA (US);

Yuhao Luo, San Jose, CA (US);

Assignee:

Xilinx, Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/3205 (2006.01);
U.S. Cl.
CPC ...
Abstract

A field-effect transistor ('FET') or similar device has a fully silicided ('FUSI') gate electrode. The gate electrode has a gate interface silicide portion between the gate dielectric and a bulk gate silicide portion. The gate interface silicide is formed by depositing a gate electrode interface layer having silicide retardation species underneath the metal/silicon layers used to form the gate silicide. The gate electrode interface layer retards silicide formation at the gate dielectric/gate electrode interface when the bulk gate silicide is formed, and the gate interface silicide is then formed at a higher temperature or longer heat cycle time.


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