The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 23, 2008
Filed:
Feb. 17, 2005
Frank C. Demarest, Higganum, CT (US);
Henry A. Hill, Tucson, AZ (US);
Frank C. Demarest, Higganum, CT (US);
Henry A. Hill, Tucson, AZ (US);
Zygo Corporation, Middlefield, CT (US);
Abstract
The invention features a method including: (i) providing an interference signal S(t) from two beams directed along different paths, wherein the signal S(t) is indicative of changes in an optical path difference n{tilde over (L)}(t) between the different paths, where n is an average refractive index along the different paths, {tilde over (L)}(t) is a total physical path difference between the different paths, and t is time; (ii) providing one or more coefficients representative of one or more errors that cause the signal S(t) to deviate from an ideal expression of the form Acos(ωt+φ(t)+ζ), where Aand ζare constants, ωis an angular frequency difference between the two beams before being directed along the different paths, and φ(t)=nk{tilde over (L)}(t), with k=2π/λ and λ equal to a wavelength for the beams; (iii) calculating a linear combination of values of the signal S(t); and (iv) reducing the effect of the deviation of S(t) from the ideal expression on an estimate of {tilde over (L)}(t) using an error signal generated from the coefficients and one or more error basis functions derived at least in part from the linear combination of values of the signal S(t).