The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7427744 B1

PDF
Full Text
Expired
Date of Patent:
Sep. 23, 2008

Filed:

Jul. 10, 2007
Applicant:

Masafumi Watanabe, Chiba, JP;

Inventor:

Masafumi Watanabe, Chiba, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 40/14 (2006.01);
U.S. Cl.
CPC ...
Abstract

A leaf springconstituting an elastic member one end of which is fixed to a foundation, and other end of which is brought into contact with a laminating type piezoelectric elementor a driven memberis constituted such that a thickness is thinned from a side of the foundationto a side of the laminating type piezoelectric elementto make a moment of inertia smaller on a side of a portion of other end held by the laminating type piezoelectric elementthan a portion on one end side fixed to the foundation. Further, a strain gage sensoris attached to a side faceof the leaf springconstituting one face of one end of the leaf springproximate to the laminating type piezoelectric elementorthogonal to a direction of elongating and contracting the laminating type piezoelectric elementconstituting a side of the driven member


Find Patent Forward Citations

Watanabe, Masafumi. (2008). Piezoelectric actuator and scanning probe microscope using the same (U.S. Patent No. 7427744). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7427744

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