The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 09, 2008

Filed:

Sep. 26, 2005
Applicants:

Rakesh Dodeja, Portland, OR (US);

Neelam Chandwani, Portland, OR (US);

Chetan Hiremath, Portland, OH (US);

Wen Wei, Beaverton, OR (US);

Udayan Mukherjee, Portland, OR (US);

Inventors:

Rakesh Dodeja, Portland, OR (US);

Neelam Chandwani, Portland, OR (US);

Chetan Hiremath, Portland, OH (US);

Wen Wei, Beaverton, OR (US);

Udayan Mukherjee, Portland, OR (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Faults are monitored with information from agents for a plurality of sensors located on a plurality of circuit boards. A policy containing a error event thresholds against which the stored sensor information can be compared. Actions can be initiated by a fault module when one or more of the error event thresholds is exceeded.


Find Patent Forward Citations

Dodeja, Rakesh. (2008). Method and apparatus to monitor stress conditions in a system (U.S. Patent No. 7424396). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7424396

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…