The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 09, 2008

Filed:

Jan. 02, 2002
Applicants:

Carl Smets, Heverlee, BE;

Karel Van Gils, Heverlee, BE;

John Zabolitsky, Heverlee, BE;

Jurgen Everaerts, Heverlee, BE;

Inventors:

Carl Smets, Heverlee, BE;

Karel Van Gils, Heverlee, BE;

John Zabolitsky, Heverlee, BE;

Jurgen Everaerts, Heverlee, BE;

Assignee:

Icos Vision Systems NV, Heverlee, BE;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and an apparatus for measuring respective positions of a set of N contact elements of an electronic component. A first and a second light path are created by a first and a second light beam which have different viewing angles. Both the first and the second light path can selectively be opened and both end into the image plane of a single camera. The positions being determined by using the first and second image produced by the first and second light beam respectively.


Find Patent Forward Citations

Smets, Carl. (2008). Method and an apparatus for measuring positions of contact elements of an electronic component (U.S. Patent No. 7423743). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7423743

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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