The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 02, 2008
Filed:
Jul. 12, 2006
Neal Meyer, Chandler, AZ (US);
Brett Neal, Gilbert, AZ (US);
Andrew Mcronald, Beaverton, OR (US);
Lee Genz, Chandler, AZ (US);
Ping Sun, Gilbert, AZ (US);
Gene Garrison, Aloha, OR (US);
Neal Meyer, Chandler, AZ (US);
Brett Neal, Gilbert, AZ (US);
Andrew McRonald, Beaverton, OR (US);
Lee Genz, Chandler, AZ (US);
Ping Sun, Gilbert, AZ (US);
Gene Garrison, Aloha, OR (US);
Intel Corporation, Santa Clara, CA (US);
Abstract
Some embodiments provide identification of a first polyline and a second polyline associated with a differential signal, determination of whether a distance between a segment of the first polyline and a segment of the second polyline is within a first tolerance, determination, if the distance is not within the first tolerance, of whether the distance is within a second tolerance, determination, if the distance is not within the first tolerance and is within the second tolerance, of whether the length of the segment of the first polyline is less than a first threshold, and to indicate that the first polyline and the second polyline are sufficiently spaced, if the distance is not within the first tolerance and is within the second tolerance, and if the length of the segment of the first polyline is less than the first threshold.