The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 02, 2008
Filed:
Dec. 04, 2003
Hidemitsu Asano, Kawasaki, JP;
Yasuo Sugita, Kawasaki, JP;
Koichi Komatsu, Kawasaki, JP;
Sadayuki Matsumiya, Kawasaki, JP;
Hidemitsu Asano, Kawasaki, JP;
Yasuo Sugita, Kawasaki, JP;
Koichi Komatsu, Kawasaki, JP;
Sadayuki Matsumiya, Kawasaki, JP;
Mitutoyo Corporation, Kawasaki, JP;
Abstract
There are provided a measuring method and a measuring system which enable creation of a measurement route with ease to thereby enable three-dimensional measurement to be quickly performed even if an object to be measured has a complicated shape or configuration. An object to be measured is shot. A plurality of images obtained by the shooting are combined together to generate a combined image of the object. A measuring region of the generated combined image is designated. A measurement path measuring program is created by inputting parameters for creating a measurement path. The designated measuring region is measured along the measurement path according to the created measurement path measuring program.