The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 26, 2008
Filed:
Jul. 22, 2002
Test interface, system, and method for testing communications devices with non-deterministic latency
Udaya S. Natarajan, Eldorado Hills, CA (US);
Udaya S. Natarajan, Eldorado Hills, CA (US);
Intel Corporation, Santa Clara, CA (US);
Abstract
A test interface is configured to connect to a testing device and a communications device. The communications device may be configured to receive a data signal (that includes a desired data portion) from the test machine. The interface may include a data capture device and a buffer. The data capture device may be configured to receive a framing pulse signal from the communications device, to receive a framing pulse enable signal from the testing device, and to generate a reset signal in response to receiving the framing pulse signal and the framing pulse enable signal. The buffer may be configured to store the data signal from the communications device, and to clear all stored data in the buffer and store the desired data portion in response to receiving the reset signal.