The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 19, 2008
Filed:
Aug. 31, 2006
Applicants:
Wenbing Yun, Walnut Creek, CA (US);
Yuxin Wang, Arlington Heights, IL (US);
Inventors:
Wenbing Yun, Walnut Creek, CA (US);
Yuxin Wang, Arlington Heights, IL (US);
Assignee:
Xradia, Inc., Concord, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 27/44 (2006.01);
U.S. Cl.
CPC ...
Abstract
A phase contrast x-ray microscope has a phase plate that is placed in proximity of and attached rigidly to the objective to form a composite optic. This enables easier initial and long-term maintenance of alignment of the microscope. In one example, they are fabricated on the same high-transmissive substrate. The use of this composite optic allows for lithographic-based alignment that will not change over the lifetime of the instrument. Also, in one configuration, the phase plate is located between the test object and the objective.