The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 19, 2008

Filed:

Sep. 27, 2002
Applicants:

Jason T. Hartlove, Los Altos, CA (US);

David S. Pitou, San Jose, CA (US);

Patricia E. Johnson, Palo Alto, CA (US);

Inventors:

Jason T. Hartlove, Los Altos, CA (US);

David S. Pitou, San Jose, CA (US);

Patricia E. Johnson, Palo Alto, CA (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 5/225 (2006.01); H04N 3/14 (2006.01); H04N 5/335 (2006.01); H04N 9/04 (2006.01); H04N 9/083 (2006.01);
U.S. Cl.
CPC ...
Abstract

A camera module includes a gradient index lens on a spacer plate attached over an array of pixel sensors and associated micro lenses. The spacer plate and gradient index lens can be formed at the wafer level during the manufacture of multiple camera modules. A process for manufacturing the camera modules thus provides tolerances and yields provided by wafer processing techniques rather than mechanical assembly.


Find Patent Forward Citations

Hartlove, Jason. (2008). Cmos image sensor using gradient index chip scale lenses (U.S. Patent No. 7414661). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7414661

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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