The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 12, 2008
Filed:
Jun. 03, 2003
Neil J. Goldfine, Newton, MA (US);
Darrell E. Schlicker, Watertown, MA (US);
Ian C. Shay, Cambridge, MA (US);
Andrew P. Washabaugh, Chula Vista, CA (US);
Neil J. Goldfine, Newton, MA (US);
Darrell E. Schlicker, Watertown, MA (US);
Ian C. Shay, Cambridge, MA (US);
Andrew P. Washabaugh, Chula Vista, CA (US);
JENTEK Sensors, Inc., Waltham, MA (US);
Abstract
For the inspection of materials and the detection and characterization of hidden objects, features, or flaws sensors and sensor arrays are used to image form two-dimensional images suitable for characterizing the hidden features. Magnetic field or eddy current based inductive and giant magnetoresistive sensors may be used on magnetizable and conducting materials, while capacitive sensors can be used for dielectric materials. Enhanced drive windings and electrode structures permit nulling or cancellation of local fields in the vicinity of the sense elements to increase sensor sensitivity. The addition of calibration windings, which are not energized during measurements, allows absolute impedance and material property measurements with nulled sensors. Sensors, sensor arrays, and support fixtures are described which permit relative motion between the drive and sense elements. This facilitates the volumetric reconstruction of hidden features and objects.