The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 12, 2008
Filed:
Aug. 09, 2004
Applicant:
Haruyoshi Ono, Yamanashi, JP;
Inventor:
Haruyoshi Ono, Yamanashi, JP;
Assignee:
Eudyna Devices Inc., Yamanashi, JP;
Primary Examiner:
Int. Cl.
CPC ...
H01J 7/24 (2006.01); G01J 3/46 (2006.01);
U.S. Cl.
CPC ...
Abstract
A wavelength measuring device includes: a light receiving element that receive light to be measured; a temperature controller that maintains the light receiving element at different temperatures; and a calculation unit that determines the wavelength of the light to be measured, based on the outputs of the light receiving elements.
Ono, Haruyoshi. (2008). Wavelength measuring device for a single light receiving element and wavelength measuring method at different temperatures (U.S. Patent No. 7411178). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7411178
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile