The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 12, 2008

Filed:

May. 17, 2006
Applicants:

Holger Schuehrer, Dresden, DE;

Christin Bartsch, Lauterbach, DE;

Carsten Hartig, Meerane, DE;

Inventors:

Holger Schuehrer, Dresden, DE;

Christin Bartsch, Lauterbach, DE;

Carsten Hartig, Meerane, DE;

Assignee:

Advanced Micro Devices, Inc., Austin, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

By performing at least one additional wet chemical etch process in the edge region and in particular on the bevel of a substrate during the formation of a metallization layer, the dielectric material, especially the low-k dielectric material, may be reliably removed from the bevel prior to the formation of any barrier and metal layers. Moreover, an additional wet chemical etch process may be performed after the deposition of the metal to remove any unwanted metal and barrier material from the edge region and the bevel. Accordingly, defect issues and contamination of substrates and process tools may be efficiently reduced.


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