The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 05, 2008

Filed:

Sep. 11, 2007
Applicant:

David A. Zimlich, Boise, ID (US);

Inventor:

David A. Zimlich, Boise, ID (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03H 11/26 (2006.01);
U.S. Cl.
CPC ...
Abstract

A measure control delay includes a measuring delay line and a signal generating delay line, each of which include a plurality of series-connected delay units. A digital signal is applied to an initial delay unit in the measuring delay line and it sequentially propagates through the delay units until a second digital signal is received. These outputs are applied to control inputs to the signal generating delay line to control the number of delay units through which a clock signal propagates before being output from a final delay unit. Each of the delay units in the measuring delay line includes a pair of series connected NOR gates. A NOR gate to which the digital signal is initially applied is coupled to a second NOR gate as a flip-flop so that the output of the NOR gate remains constant after the digital signal has been applied to the measuring delay line.


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