The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 05, 2008
Filed:
Jun. 27, 2005
Applicant:
Hendrik Gezinus Tappel, Eindhoven, NL;
Inventor:
Hendrik Gezinus Tappel, Eindhoven, NL;
Assignee:
FEI Company, Hillsboro, OR (US);
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/244 (2006.01);
U.S. Cl.
CPC ...
Abstract
The invention provides a method for the removal of a microscopic samplefrom a substratecomprising the steps of:
Tappel, Hendrik. (2008). Method for the removal of a microscopic sample from a substrate (U.S. Patent No. 7408178). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7408178
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile