The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 05, 2008
Filed:
Apr. 25, 2005
Dirk Schafer, Hamburg, DE;
Georg Rose, Dusseldorf, DE;
Jens Wiegert, Aachen, DE;
Michael Overdick, Langerwehe, DE;
Walter Rutten, Linnich, DE;
Dirk Schafer, Hamburg, DE;
Georg Rose, Dusseldorf, DE;
Jens Wiegert, Aachen, DE;
Michael Overdick, Langerwehe, DE;
Walter Rutten, Linnich, DE;
Koninklijke Philips Electronics, N.V., Eindhoven, NL;
Abstract
The invention relates to an X-ray detector () with an array () of sensor elements (), wherein each row (i) of sensor elements is connected via an addressing line to an addressing unit (), and wherein each column j) of sensor elements is connected via a read-out line to a read-out unit (). In the read-out unit (), sensor signals are preprocessed, for example amplified by amplifiers (). The detector further comprises a control unit () which is adapted to set the gains of said amplifiers () for each column (j) and each row (i) individually. The values of the gains may particularly be derived from a priori knowledge, from previous images of the object, or from the image signals of rows that have already been read out.