The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 29, 2008
Filed:
Jun. 29, 2005
Phillip R. Gibbs, Atlanta, GA (US);
Jason D. Beebe, Atlanta, GA (US);
Phillip R. Gibbs, Atlanta, GA (US);
Jason D. Beebe, Atlanta, GA (US);
Other;
Abstract
An apparatus and method for improved detection of a chiral property of a sample begins with a probe beam of light having a first modulation frequency ω and is further modulated with a second modulation frequency φ. A non-linear photo-detector, which may include multiple detector portions to form a balanced receiver, mixes the first modulation with the second modulation to analyze frequency components at inter-modulated sidebands, where the level of the inter-modulated sidebands are related to the chiroptical property of the sample. The inter-modulated sidebands may be the additive sidebands or the subtractive sidebands. A lock-in detector can be used to receive a signal output from the non-linear photo-detector and generate the modulation signals at the different modulating frequencies. Furthermore, the non-linear photo-detector may analyze a ratio of the inter-modulated sideband levels, such as (φ+2ω)/(φ+ω), to yield a signal that is linearly related to the chiral property of the sample.